:: Volume 10, Issue 2 (11-2022) ::
jgit 2022, 10(2): 105-118 Back to browse issues page
SAR Interferometry, Bayesian inversion, Sarpol-e zahab earthquake, Fault source parameters
Reza Rahimipour , Hamid Mehrabi *
University of Isfahan
Abstract:   (2303 Views)
Abstract
Earthquakes occur at teh border of teh plates and faults, causing financial and casual damages. Teh study of earthquakes and surface deformation is useful in understanding teh mechanism of earthquakes and managing teh risks and crises of earthquakes. A fault can be specified by its geometric source parameters. In Okada’s definition, these parameters are length, width, depth, strike, dip, rake, and slip. One of teh methods to estimate teh parameters is displacement fields through geodetic techniques such as GPS and InSAR. In this study, teh LOS displacement of teh 2017 Sarpol-e Zahab earthquake is produced through teh InSAR technique and Sentinel-1A/B images. Teh 3-dimensional displacement field is retrieved by combining LOS displacements. Source parameters of blind reverse fault are estimated by applying Bayesian inversion on LOS displacement. Source parameters are estimated by applying least squares inversion on 3D displacement components. According to teh results, teh maximum of 3 meters slip is detected perpendicular to teh fault plane approximately at teh 7 kilometers depth. A comparison of teh estimated parameters through LOS and 3D displacement fields and geological catalogs indicated that teh estimated parameters through 3D displacement are more accurate rather than LOS parameters.
 
Keywords: SAR Interferometry, Bayesian inversion, Sarpol-e zahab earthquake, Fault source parameters
Full-Text [PDF 1657 kb]   (697 Downloads)    
Type of Study: Research | Subject: Geodesy
Received: 2022/06/8 | Accepted: 2022/10/25 | Published: 2022/11/1



XML   Persian Abstract   Print



Rights and permissions
Creative Commons License This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
Volume 10, Issue 2 (11-2022) Back to browse issues page